Metrology for Quantum Communication technologies

被引：0
|
作者：
Rastello, M. L. [1 ]
机构：
[1] INRIM Ist Nazl Ric Metrol, I-10135 Turin, Italy
来源：
METROLOGY AND PHYSICAL CONSTANTS | 2013年 / 185卷
关键词：
INFRARED SPECTRAL RADIANCE; EFFICIENCY MEASUREMENTS; TRAP DETECTORS; HIGH-ACCURACY; CORRELATED PHOTONS; SELF-CALIBRATION; ABSOLUTE; PHOTODETECTORS; REFLECTANCE; RESPONSIVITY;
D O I：
10.3254/978-1-61499-326-1-243
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
This paper reviews the state of the art and metrological tools to characterize the parameters of the individual optical components that are used in Quantum Communication systems. These parameters are critical to Quantum Communication performance to improving the device performance through selection from characterised components and providing traceable measurements. A statement is made on the estimated uncertainties for each measurement.
引用
收藏
页码：243 / 271
页数：29
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