Analog and mixed signal test techniques for SOC development

被引：0
|
作者：
Kaminska, B [1 ]
Sunter, S
Mir, S
机构：
[1] Simon Fraser Univ, Burnaby, BC V5A 1S6, Canada
[2] TIMA Labs, Grenoble, France
来源：
MICROELECTRONICS JOURNAL | 2005年 / 36卷 / 12期
关键词：
D O I：
10.1016/j.mejo.2005.06.002
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1063 / 1063
页数：1
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