Determination of the rate-dependent adhesion of polydimethylsiloxane using an atomic force microscope

被引：6
|
作者：
Petroli, Alessandra [1 ,2 ]
Petroli, Mario [3 ]
Romagnoli, Marcello [4 ]
Geoghegan, Mark [1 ,5 ,6 ]
机构：
[1] Univ Sheffield, Dept Phys & Astron, Hounsfield Rd, Sheffield S3 7RH, England
[2] Univ Bologna, Dipartimento Chim Ind Toso Montanari, Viale Risorgimento 4, I-40136 Bologna, Italy
[3] Univ Bologna, CESIA, Viale Filopanti 3, I-40126 Bologna, Italy
[4] Univ Modena & Reggio Emilia, Dipartimento Ingn Enzo Ferrari, Via Pietro Vivarelli 10, I-41125 Modena, Italy
[5] Univ Modena & Reggio Emilia, Dipartimento Sci Vita, Via G Campi 103, I-41125 Modena, Italy
[6] Newcastle Univ, Sch Engn, Merz Court, Newcastle Upon Tyne NE1 7RU, England
来源：
POLYMER | 2022年 / 262卷
基金：
英国工程与自然科学研究理事会;
关键词：
SURFACE-ENERGY; DEFORMATION; MECHANICS; CONTACT; JKR; POLY(DIMETHYLSILOXANE); FRICTION; ADHERENCE; POLYMER; MEMS;
D O I：
10.1016/j.polymer.2022.125445
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
A JKR (Johnson-Kendall-Roberts) formalism is used to extract the Young modulus, the contact radius, and the energy release rate simply from the retraction curve of a borosilicate glass colloidal probe from a polydimethylsiloxane (PDMS) surface using an atomic force microscope. PDMS samples ranged from perfectly elastic to those with incipient viscoelasticity. The dependence of the release rate energy with the crack speed is verified using a fracture mechanics-based method.
引用
收藏
页数：8
相关论文
共 50 条
  • [31] Analysis of the adhesion effect in RF-MEMS switches using atomic force microscope
    Birleanu, Corina
    Pustan, Marius
    2014 SYMPOSIUM ON DESIGN, TEST, INTEGRATION AND PACKAGING OF MEMS/MOEMS (DTIP), 2014, : 146 - 152
  • [32] Characterisation of membrane surfaces: direct measurement of biological adhesion using an atomic force microscope
    Bowen, WR
    Hilal, N
    Lovitt, RW
    Wright, CJ
    JOURNAL OF MEMBRANE SCIENCE, 1999, 154 (02) : 205 - 212
  • [33] Analysis of the adhesion effect in RF-MEMS switches using atomic force microscope
    Corina Birleanu
    Marius Pustan
    Analog Integrated Circuits and Signal Processing, 2015, 82 : 571 - 581
  • [34] Direct quantification of Aspergillus niger spore adhesion in liquid using an atomic force microscope
    Bowen, WR
    Lovitt, RW
    Wright, CJ
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2000, 228 (02) : 428 - 433
  • [35] Analysis of the adhesion effect in RF-MEMS switches using atomic force microscope
    Birleanu, Corina
    Pustan, Marius
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2015, 82 (03) : 571 - 581
  • [36] The measurement of adhesion forces in the system "cell-cell" by using atomic force microscope
    Shevchenko, Tatyana S.
    Skorkina, Marina Yu
    Zhernakova, Nina, I
    Shentseva, Elena A.
    REVISTA LATINOAMERICANA DE HIPERTENSION, 2019, 14 (05): : 550 - +
  • [37] Adhesion enhancement in a dimpled surface with axisymmetric waviness and rate-dependent work of adhesion
    Papangelo, A.
    Ciavarella, M.
    JOURNAL OF ADHESION, 2022, 98 (13): : 1957 - 1971
  • [38] Friction, adhesion, and deformation: dynamic measurements with the atomic force microscope
    Attard, P
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2002, 16 (07) : 753 - 791
  • [39] Friction, adhesion, and deformation: Dynamic measurements with the atomic force microscope
    Attard, P. (phil.attard@unisa.edu.au), 1600, Taylor and Francis Ltd. (16):
  • [40] Evaluating protein attraction and adhesion to biomaterials with the atomic force microscope
    Wang, MS
    Palmer, LB
    Schwartz, JD
    Razatos, A
    LANGMUIR, 2004, 20 (18) : 7753 - 7759
12345