Understanding and Modeling AC BTI

被引：82

作者：

Reisinger, Hans ^{[1
]}

Grasser, Tibor ^{[2
]}

Ermisch, Karsten ^{[1
]}

Nielen, Heiko ^{[1
]}

Gustin, Wolfgang ^{[1
]}

Schluender, Christian ^{[1
]}

机构：

[1] Infineon Technol, Campeon 1-12, D-85579 Neubiberg, Germany

[2] Vienna Univ Technol, Inst Microelect, A-1040 Vienna, Austria

来源：

2011 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2011年

关键词：

AC-stress; NBTI; recovery; BIAS TEMPERATURE INSTABILITY; DEGRADATION; NBTI;

D O I：

10.1109/IRPS.2011.5784542

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present a model for AC NBTI which is based on capture and emission of charges in and out of oxide border traps. Capture and emission time constants of these traps are widely distributed from <mu s to >10(5)s and have been experimentally determined. The model gives a good quantitative understanding of experimental data from alternating stress / recovery sequences. It also provides a physical understanding of all the special features seen in AC NBTI independently of technology parameters.

引用

页数：8

共 50 条

[31] Benchmarking BTI Reliability in Scaled FETs with TMD Channels via Predictive Modeling
Chai, Y. J.
Lv, Y. Z.
Illarionov, Yu Yu
2024 IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS, IPFA 2024, 2024,
[32] System-Level Modeling of Microprocessor Reliability Degradation Due to BTI and HCI
Chen, Chang-Chih
Cha, Soonyoung
Liu, Taizhi
Milor, Linda
2014 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2014,
[33] Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling
Wu, Zhicheng
Franco, Jacopo
Claes, Dieter
Rzepa, Gerhard
Roussel, Philippe J.
Collaert, Nadine
Groeseneken, Guido
Linten, Dimitri
Grasser, Tibor
Kaczer, Ben
2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2019,
[34] Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited)
Tan, Sheldon X. -D.
Amrouch, Hussam
Kim, Taeyoung
Sun, Zeyu
Cook, Chase
Henkel, Joerg
INTEGRATION-THE VLSI JOURNAL, 2018, 60 : 132 - 152
[35] A CONTRIBUTION TO THE UNDERSTANDING OF AC ANODIZING OF ALUMINUM
BARBOSA, MA
GABE, DR
ROSS, DH
SUTHERLAND, I
JOURNAL OF APPLIED ELECTROCHEMISTRY, 1989, 19 (06) : 829 - 838
[36] Understanding AC GTAW balance control
Williams, Brent
WELDING JOURNAL, 2006, 85 (11) : 64 - 65
[37] Unified RTN and BTI statistical compact modeling from a defect-centric perspective
Pedreira, G.
Martin-Martinez, J.
Saraza-Canflanca, P.
Castro-Lopez, R.
Rodriguez, R.
Roca, E.
Fernandez, F., V
Nafria, M.
SOLID-STATE ELECTRONICS, 2021, 185
[38] Modeling of BTI-Aging VT Stability for Advanced Planar and FinFET SRAM Reliability
Lee, Y. -H.
Lee, J. H.
Tsai, Y. S.
Mukhopadhyay, S.
Wang, Y. F.
2017 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2017), 2017, : 85 - 88
[39] Fast acquisition of activation energy maps using temperature ramps for lifetime modeling of BTI
Puschkarsky, K.
Reisinger, H.
Schuender, C.
Gustin, W.
Grasser, T.
2018 48TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC), 2018, : 218 - 221
[40] Analysis and Modeling of AC-AC Switched Capacitor Converters
Cai, Hui
Bao, Liting
Guo, Qian
Wang, Ying
Chen, Weimin
JOURNAL OF POWER ELECTRONICS, 2019, 19 (01) : 24 - 33

← 1 2 3 4 5 →