共 50 条
- [1] A D&T Roundtable - Deep submicron test in cooperation with the Test Technology Technical Committee IEEE DESIGN & TEST OF COMPUTERS, 1996, 13 (03): : 102 - 108
- [2] A D&T roundtable: Built-in self-test for designers - Discussion IEEE DESIGN & TEST OF COMPUTERS, 1997, 14 (03): : 113 - 121
- [3] D&T roundtable:: Power delivery and distribution IEEE DESIGN & TEST OF COMPUTERS, 2000, 17 (04): : 98 - 102
- [4] A D&T roundtable: Hardware software codesign IEEE DESIGN & TEST OF COMPUTERS, 1997, 14 (01): : 75 - 83
- [5] A D&T roundtable -: Relative effectiveness of tests IEEE DESIGN & TEST OF COMPUTERS, 1998, 15 (01): : 83 - 90
- [6] A D&T roundtable: Deep-submicron design IEEE DESIGN & TEST OF COMPUTERS, 1996, 13 (02): : 83 - 89
- [7] A D&T roundtable -: Testing mixed logic and DRAM chips IEEE DESIGN & TEST OF COMPUTERS, 1998, 15 (02): : 86 - 92
- [8] Challenges for low-power and high-performance chips -: A D&T roundtable IEEE DESIGN & TEST OF COMPUTERS, 1998, 15 (03): : 119 - 124