A D&T Roundtable - Deep submicron test in cooperation with the Test Technology Technical Committee

被引：0
|
作者：
Zorian, Y
Butler, KM
Maly, W
Koenemann, BK
Needham, W
Aitken, RC
Campbell, RL
机构：
[1] TEXAS INSTRUMENTS INC,DESIGN AUTOMAT DIV,GRP TECH STAFF,DALLAS,TX
[2] HEWLETT PACKARD CORP,DESIGN TECHNOL CTR,TECH STAFF,PALO ALTO,CA
[3] TEXAS INSTRUMENTS INC,DESIGN AUTOMAT DIV,DALLAS,TX
[4] LV SOFTWARE,SAN JOSE,CA
[5] CARNEGIE MELLON UNIV,DEPT ELECT & COMP ENGN,PITTSBURGH,PA 15213
[6] INTEL,LOG TEST METHODOL GRP,CHANDLER,AZ
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1996年 / 13卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：102 / 108
页数：7
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