Embedded test and measurement critical for deep submicron technology

被引：1
|
作者：
Agarwal, VK
机构：
来源：
SIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGS | 1997年
关键词：
D O I：
10.1109/ATS.1997.643905
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
引用
收藏
页码：2 / 2
页数：1
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