Robust ESD protection for high brightness GaN LEDs using new TVS Zener diodes

被引:3
|
作者
Choi, S. S. [1 ]
Cho, D. H. [2 ]
Choi, C. J. [1 ]
Kim, J. Y. [1 ]
Yang, J. W. [1 ]
Shim, K. H. [1 ,2 ]
机构
[1] Chonbuk Natl Univ, Dept Semicond Sci & Technol, Semicond Phys Res Ctr, Deokjinku 561756, Jeonju, South Korea
[2] Chonbuk Natl Univ, Dept Semicond Sci & Technol, Sigetronics Inc, R&D Div, Deokjinku 561756, Jeonju, South Korea
关键词
TRANSIENT VOLTAGE SUPPRESSOR; JUNCTIONS;
D O I
10.1088/0268-1242/26/5/055009
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The electrostatic discharge (ESD) stability of GaN-based LEDs, which are assembled with new transient voltage suppression (TVS) Zener diodes, has been characterized in experiments on reverse leakage current and functionality. Advantageous features of TVS Zener diodes with extremely low differential resistance and low leakage current have enhanced their ESD protection capability, especially at high temperature. The TVS Zener presented an excellent performance in protecting GaN-based LEDs from ESD stress exceeding the human body model +/- 8 kV at 110 degrees C. The ESD robustness of the high-temperature stability is analyzed in order to provide proper reliability under hostile environment of massive heat and light delivered from LEDs.
引用
收藏
页数:5
相关论文
共 50 条
  • [11] Analysis of ESD protection for high power GaN-based light-emitting diodes
    Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
    Bandaoti Guangdian/Semiconductor Optoelectronics, 2007, 28 (04): : 474 - 477
  • [12] Improved reliability and ESD characteristics of flip-chip GaN-based LEDs with internal inverse-parallel protection diodes
    Shei, Shih-Chang
    Sheu, Jinn-Kong
    Shen, Chien-Fu
    IEEE ELECTRON DEVICE LETTERS, 2007, 28 (05) : 346 - 349
  • [13] High brightness GaN LEDs degradation during dc and pulsed stress
    Meneghini, M.
    Podda, S.
    Morelli, A.
    Pintus, R.
    Trevisanello, L.
    Meneghesso, G.
    Vanzi, M.
    Zanoni, E.
    MICROELECTRONICS RELIABILITY, 2006, 46 (9-11) : 1720 - 1724
  • [14] Fabrication of high-brightness blue InGaN/GaN MQW LEDs
    Luo, Y
    Han, YJ
    Guo, WP
    Sun, CZ
    Hao, ZB
    Hu, H
    MATERIALS, DEVICES, AND SYSTEMS FOR DISPLAY AND LIGHTING, 2002, 4918 : 197 - 199
  • [15] High brightness LEDs for general lighting applications using the new ThinGaN™-technology
    Haerle, V
    Hahn, B
    Kaiser, S
    Weimar, A
    Bader, S
    Eberhard, F
    Plössl, A
    Eisert, D
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2004, 201 (12): : 2736 - 2739
  • [16] Active Pulse Shaping Circuit for Bandwidth Enhancement of High-Brightness LEDs using GaN Devices
    Modepalli, Kumar
    Parsa, Leila
    THIRTY-THIRD ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2018), 2018, : 3471 - 3476
  • [17] High-brightness LEDs: The new trend in illumination
    Fischer, AL
    PHOTONICS SPECTRA, 2006, 40 (01) : 92 - 93
  • [18] Design of high brightness cubic-GaN LEDs grown on GaAs substrate
    Sun, YP
    Shen, XM
    Zhang, ZH
    Zhao, DG
    Feng, ZH
    Fu, Y
    Zhang, SN
    Yang, H
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2003, 42 : S753 - S756
  • [19] Towards industrialisation of GaN-on-Si based high brightness blue LEDs
    Zhang, Liyang
    Tan, Wei Sin
    Westwater, Simon
    Pujol, Antoine
    Pinos, Andrea
    Mezouari, Samir
    Stribley, Kevin
    Whiteman, John
    Shannon, John
    Strickland, Keith
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 13 NO 5-6, 2016, 13 (5-6): : 266 - 269
  • [20] Compact Lamp Using High-Brightness LEDs
    Pinto, Rafael A.
    Cosetin, Marcelo R.
    Marchesan, Tiago B.
    Cervi, Murilo
    Campos, Alexandre
    do Prado, Ricardo N.
    2008 IEEE INDUSTRY APPLICATIONS SOCIETY ANNUAL MEETING, VOLS 1-5, 2008, : 88 - 92