Achieving at-speed structural test

被引：27
|
作者：
Pateras, S [1 ]
机构：
[1] LogicVis, San Jose, CA 95110 USA
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2003年 / 20卷 / 05期
关键词：
D O I：
10.1109/MDT.2003.1232253
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In addition to structural test, BIST offers an alternative low-cost approach to at-speed testing. How should BIST be implemented to address at-speed testing? What issues remain to be solved? How can we deal with multicycle paths and different frequency domains? The author describes BIST implementation techniques to answer these questions.
引用
收藏
页码：26 / 33
页数：8
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