Magnetic devices - Semiconductor junctions - Signal to noise ratio - Magnetic anisotropy - Magnetization - Tunnel junctions;
D O I:
10.1063/5.0073902
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Spintronic rf detectors are efficient nanoscale counterparts to conventional semiconductor-based components for energy harvesting and wireless communication at low input power. Here, we report on the optimization of the rectified output dc voltage using magnetic tunnel junctions (MTJs) with strong perpendicular anisotropy of both the polarizing and free layers. The magnetization of the polarizing layer is fixed out-of-plane, while the free layer thickness is adjusted so that its magnetization orientation changes from in-plane to out-of-plane. Rectification dc output voltages in the mV range are obtained for moderate rf source powers with a signal-to-noise ratio of 26-39 dB for P-rf = -25 dBm and a sensitivity epsilon of 300 mV/mW. The rectified signal shows a strong dependence on MTJ dimensions: it increases by a factor of 5-6 when reducing the diameter from 180 to 50 nm. Furthermore, this enhancement can be doubled when reducing the free layer thickness from 1.8 to 1.6 nm. This size-related enhancement is attributed to several jointly acting effects: the amplitude of the spin transfer torque that depends inversely on the diameter, the effective anisotropy that depends on the thickness of the excited layer, and the tunneling magneto-resistance ratio that for the devices studied here depends on diameter. The obtained results indicate that the geometry of the MTJ can be used to design spintronic based rf detectors with optimized sensitivity.
机构:
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
China Aerospace Science & Technology Corporation No.5 Academy No.513 Institute, YantaiState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
Du W.
Wang L.
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机构:
China Aerospace Science & Technology Corporation No.5 Academy No.513 Institute, Yantai
Shandong Huayu Aerospace Technology Company Limited, YantaiState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
Wang L.
Zhong Y.
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机构:
China Aerospace Science & Technology Corporation No.5 Academy No.513 Institute, Yantai
Shandong Huayu Aerospace Technology Company Limited, YantaiState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
Zhong Y.
Xu T.
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机构:
China Aerospace Science & Technology Corporation No.5 Academy No.513 Institute, YantaiState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
Xu T.
Guan Y.
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机构:
China Aerospace Science & Technology Corporation No.5 Academy No.513 Institute, YantaiState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
Guan Y.
Liu X.
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机构:
China Aerospace Science & Technology Corporation No.5 Academy No.513 Institute, YantaiState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
Liu X.
Ren S.
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机构:
China Aerospace Science & Technology Corporation No.5 Academy No.513 Institute, YantaiState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
Ren S.
Cheng Y.
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机构:
China Aerospace Science & Technology Corporation No.5 Academy No.513 Institute, YantaiState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
Cheng Y.
Tang X.
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机构:
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, ChengduState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu
机构:
Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Clark, B. D.
Natarajarathinam, A.
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机构:
Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Macalester Coll, St Paul, MN 55105 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Natarajarathinam, A.
Tadisina, Z. R.
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机构:
Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Intel, Hillsboro, OR USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Tadisina, Z. R.
Chen, P. J.
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机构:
NIST, Gaithersburg, MD 20899 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Chen, P. J.
Shull, R. D.
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NIST, Gaithersburg, MD 20899 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
Shull, R. D.
Gupta, S.
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Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
机构:
Columbia Univ, Dept Chem, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Paoletta, Angela L.
Fung, E-Dean
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机构:
Columbia Univ, Dept Appl Phys & Appl Math, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA
Fung, E-Dean
Venkataraman, Latha
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机构:
Columbia Univ, Dept Chem, New York, NY 10027 USA
Columbia Univ, Dept Appl Phys & Appl Math, New York, NY 10027 USAColumbia Univ, Dept Chem, New York, NY 10027 USA