Atomic force microscopy - Part 8: Visualization of granular nanostructure in crystalline polymers

被引：0

作者：

Magonov, S ^{[1
]}

Godovsky, Y ^{[1
]}

机构：

[1] Digital Instruments, Santa Barbara, CA 93117 USA

来源：

AMERICAN LABORATORY | 1999年 / 31卷 / 08期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

AFM applications are becoming important in the rubber and polymer industries. AFM was introduced for 3-D profiling of surfaces with angstrom resolution. However, its practical value is greatly enhanced due to the diversity of material properties that can be examined with this and related methods on the submicron scale.

引用

页码：52 / +

页数：8

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