A 65-nm 25.1-ns 30.7-fJ Robust Subthreshold Level Shifter With Wide Conversion Range

被引:55
|
作者
Zhao, Wenfeng [1 ]
Alvarez, Anastacia B. [1 ]
Ha, Yajun [2 ]
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore
[2] ASTAR, Inst Infocomm Res I2R, Singapore 117576, Singapore
关键词
Inverse narrow width effect (INWE); level shifter (LS); MTCMOS; NMOS-diode current limiter; sub-/near-threshold; CONVERTER; OPERATION;
D O I
10.1109/TCSII.2015.2406354
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Level shifters (LS) are crucial interface circuits for multisupply voltage designs, and it is challenging to achieve both robust and efficient level conversion from subthreshold to aforementioned threshold. In this brief, we propose two circuit techniques for a novel subthreshold LS with wide conversion range. First, we introduce a novel LS circuit with NMOS-diode-based current limiter for current contention reduction to achieve robust and efficient level conversion. Second, we explore the inverse narrow width effect to increase the drivability of the pull-down devices for delay reduction. When implemented in a commercial 65-nm MTCMOS process, the proposed LS achieves robust conversion from deep subthreshold (sub-100 mV) to nominal supply voltage (1.2 V). For the target conversion from 0.3 to 1.2 V, the proposed LS shows on average 25.1-ns propagation delay, 30.7-fJ energy efficiency, and 2.5-nW leakage power across 25 test chips.
引用
收藏
页码:671 / 675
页数:5
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