Subthreshold leakage due to 1/f noise and RTS(random telegraph signals)

被引：1
|
作者：
Miller, Drake A. [1 ]
Poocharoen, Panupat [1 ]
Forbes, Leonard [1 ]
机构：
[1] Oregon State Univ, Sch Elect Engn & Comp Sci, Corvallis, OR 97331 USA
来源：
2007 IEEE WORKSHOP ON MICROELECTRONICS AND ELECTRON DEVICES | 2007年
关键词：
subthreshold current; subthreshold models; leakage current; memory retention time;
D O I：
10.1109/WMED.2007.368840
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
An analysis of subthreshold leakage predicts a Gaussian or Normal distribution on large devices but a distorted distribution is possible on small devices. 1/f noise due to RTS signals on large well behaved devices will have a Gaussian distribution and cause a Gaussian current distribution under normal and subthreshold operating conditions. Localized channels or percolation channels can cause a distortion of this distribution and large subthreshold leakage current pulses which are most obvious in small devices.
引用
收藏
页码：23 / 24
页数：2
相关论文
共 50 条
  • [31] Time-Dependent Random Threshold Voltage Variation Due to Random Telegraph Noise
    Wirth, Gilson
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (01) : 17 - 23
  • [32] Comparison of Statistical Distributions of Random Telegraph Noise (RTN) in Subthreshold Region and Strong Inversion Region
    Ohno, Hitoshi
    Mizutani, Tomoko
    Saraya, Takuya
    Hiramoto, Toshiro
    [J]. 2014 IEEE SILICON NANOELECTRONICS WORKSHOP (SNW), 2014,
  • [33] Time Dependent Threshold Voltage Variability due to Random Telegraph Noise
    Wirth, Gilson
    [J]. LATIN AMERICAN ELECTRON DEVICES CONFERENCE (LAEDC 2020), 2020,
  • [34] RTS and 1/f Noise in Ge Nanowire Transistors
    Pogany, D.
    Zeiner, C.
    Bychikhin, S.
    Burchhart, T.
    Lugstein, A.
    Vandamme, L. K. J.
    [J]. 2011 21ST INTERNATIONAL CONFERENCE ON NOISE AND FLUCTUATIONS (ICNF), 2011, : 368 - 371
  • [35] 1/f and RTS noise in InGaAs nanowire MOSFETs
    Mohle, C.
    Zota, C. B.
    Hellenbrand, M.
    Lind, E.
    [J]. MICROELECTRONIC ENGINEERING, 2017, 178 : 52 - 55
  • [36] Random telegraph signal (RTS) noise and other anomalies in the near-infrared detector systems for the Euclid mission
    Kohley, Ralf
    Barbier, Remi
    Kubik, Bogna
    Ferriol, Sylvain
    Clemens, Jean-Claude
    Ealet, Anne
    Secroun, Aurelia
    Conversi, Luca
    Strada, Paolo
    [J]. HIGH ENERGY, OPTICAL, AND INFRARED DETECTORS FOR ASTRONOMY VII, 2016, 9915
  • [37] Impact of carbon concentration on 1/f noise and random telegraph signal noise in SiGe:C heterojunction bipolar transistors
    Raoult, J.
    Pascal, F.
    Delseny, C.
    Marin, M.
    Deen, M. J.
    [J]. JOURNAL OF APPLIED PHYSICS, 2008, 103 (11)
  • [38] 1/f- and random telegraph noise of thermoelectric CoSb3 skutterudite thin films
    Lonsky, M.
    Heinz, S.
    Mueller, J.
    Daniel, M.
    Albrecht, M.
    [J]. 2015 INTERNATIONAL CONFERENCE ON NOISE AND FLUCTUATIONS (ICNF), 2015,
  • [39] Low-frequency noise spectrum of cyclo-stationary random telegraph signals
    Gilson Wirth
    Roberto da Silva
    [J]. Electrical Engineering, 2008, 90 : 435 - 441
  • [40] Low-frequency noise spectrum of cyclo-stationary random telegraph signals
    Wirth, Gilson
    da Silva, Roberto
    [J]. ELECTRICAL ENGINEERING, 2008, 90 (06) : 435 - 441
12345