STM investigation of silicon surfaces for fabrication of the kane quantum computer

被引:0
|
作者
Schofield, SR [1 ]
O'Brien, JL [1 ]
Simmons, MY [1 ]
Clark, RG [1 ]
Dzurak, AS [1 ]
Kane, BE [1 ]
Hawley, ME [1 ]
Brown, GW [1 ]
Curson, NJ [1 ]
机构
[1] Univ New S Wales, Sch Phys, Ctr Quantum Comp Technol, Sydney, NSW 2052, Australia
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暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The fabrication of the Kane quantum computer requires the ability to create an ordered array of phosphorus atoms in an otherwise pure silicon crystal. An intricate fabrication strategy has been employed to achieve these goals, requiring atomic precision imaging and manipulation of silicon based. surfaces. Here we present detailed scanning tunnelling microscopy (STM) results at various stages of this fabrication process. In particular, we demonstrate our ability to prepare low defect density Si(001)2 x 1 surfaces and passivate these surfaces with either monolayer or submonolayer hydrogen coverages. The Si(001)2 x 1 surface is imaged at elevated temperatures and the results suggest that phosphorus arrays fabricated on the surface would survive their encapsulation in silicon provided the substrate is not heated above 750 K. These results highlight the stability of the silicon (001) surface for single atom engineering.
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页码:292 / 296
页数:5
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