Publication of apparently unreliable book on Fowler-Nordheim Field Emission

被引:0
|
作者
Forbes, Richard G. [1 ,2 ]
机构
[1] Univ Surrey, Adv Technol Inst, Fac Engn & Phys Sci, Guildford GU2 7XH, Surrey, England
[2] Univ Surrey, Dept Elect Engn, Fac Engn & Phys Sci, Guildford GU2 7XH, Surrey, England
关键词
Field electron emission; semiconductors;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This conference poster comments on the reliability of a recently published book on the topic of "Fowler-Nordheim Field Emission: Effects in Semiconductor Nanostructures". The precise origin of important equations in the book is unclear, and one important equation checked apparently does not reduce to a Fowler-Nordheim-type equation in circumstances where it ought to do so. It is concluded that the derivations of equations in this book need to be checked before scientific use.
引用
收藏
页数:2
相关论文
共 50 条
  • [41] Electric field and temperature dependence of the stress induced leakage current: Fowler-Nordheim or Schottky emission?
    Riess, P
    Ghibaudo, G
    Pananakakis, G
    Brini, J
    Ghidini, G
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1999, 245 : 48 - 53
  • [42] Analysis of the slope of the Fowler-Nordheim plot for field emission from n-type semiconductors
    Chung, MS
    Yoon, BG
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (01): : 548 - 551
  • [43] VALUES OF FOWLER-NORDHEIM FIELD EMISSION FUNCTIONS - V(Y) T(Y) AND S(Y)
    MILLER, HC
    [J]. JOURNAL OF THE FRANKLIN INSTITUTE-ENGINEERING AND APPLIED MATHEMATICS, 1966, 282 (06): : 382 - &
  • [44] The Fowler-Nordheim Plot Behavior and Mechanism of Field Electron Emission from ZnO Tetrapod Structures
    Al-Tabbakh, Ahmed A.
    More, Mahendra A.
    Joag, Dilip S.
    Mulla, Imtiaz S.
    Pillai, Vijayamohanan K.
    [J]. ACS NANO, 2010, 4 (10) : 5585 - 5590
  • [45] Fowler-Nordheim high electric field stress of power VDMOSFETs
    Ristic, GS
    Pejovic, MM
    Jaksic, AB
    [J]. SOLID-STATE ELECTRONICS, 2005, 49 (07) : 1140 - 1152
  • [46] Field emission calculations revisited with Murphy and Good theory: a new interpretation of the Fowler-Nordheim plot
    Dionne, M.
    Coulombe, S.
    Meunier, J-L
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2008, 41 (24)
  • [47] Device applied Fowler-Nordheim relationship
    Nicolaescu, D
    Filip, V
    Itoh, J
    Okuyama, F
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (08): : 4802 - 4805
  • [48] Electron emission theory and its application: Fowler-Nordheim equation and beyond
    Jensen, KL
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (04): : 1528 - 1544
  • [49] More about the extraction of emission area from Fowler-Nordheim plots
    Forbes, RG
    [J]. TECHNICAL DIGEST OF THE 16TH INTERNATIONAL VACUUM MICROELECTRONICS CONFERENCE, 2003, : 89 - 89
  • [50] FOWLER-NORDHEIM TUNNELING IN MIS STRUCTURES
    KRIEGER, G
    SWANSON, RM
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (10) : 1237 - 1238