Asymmetric Backscattering of Ultraviolet Light by Low-Refractive Index Thin Film of Tilted Alumina Nanorods

被引：0

作者：

Yan, Xing ^{[1
]}

Natarajan, Kamaraju ^{[2
]}

Saxena, Tanuj ^{[2
]}

Shur, Michael S. ^{[1
,2
]}

机构：

[1] Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, Troy, NY 12180 USA

[2] Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12180 USA

来源：

2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2013年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Asymmetric backscattering was observed at 266 nm for tilted alumina nanorods array. Novel approach for modeling of light scattering by nanoporous films was proposed and was shown to be in good agreement with measured data.

引用

页数：2

共 44 条

[41] Simultaneous identification of the low-field-induced tiny variation of complex refractive index for anisotropic and opaque magnetic-fluid thin film by a stable heterodyne Mach-Zehnder interferometer
Hong, Chin-Yih
Chieh, Jen-Jie
Yang, Shieh-Yueh
Yang, Hong-Chang
Horng, Herng-Er
APPLIED OPTICS, 2009, 48 (29) : 5604 - 5611
[42] COMPLETE ONLINE DETERMINATION OF BIOPOLYMER MOLECULAR-WEIGHT VIA HIGH-PERFORMANCE LIQUID-CHROMATOGRAPHY COUPLED TO LOW-ANGLE LASER-LIGHT SCATTERING, ULTRAVIOLET, AND DIFFERENTIAL REFRACTIVE-INDEX DETECTION
STUTING, HH
KRULL, IS
ANALYTICAL CHEMISTRY, 1990, 62 (19) : 2107 - 2114
[43] Low-temperature and rapid photo-annealing process for metal-oxide thin-film transistors using combined excimer deep-ultraviolet and intensely pulsed light irradiation
Shin, Jaehak
Kim, Jaemin
Park, Sungmin
Kim, Soo Jin
Lim, Jung Ah
Ko, Sunglim
ORGANIC ELECTRONICS, 2022, 104
[44] DOUBLE-TUNED LIGHT-ABSORPTION CHARACTERISTICS IN THE ATTENUATED-TOTAL-REFLECTION STRUCTURE CONTAINING A METAL-CLAD DIELECTRIC-FILM WAVE-GUIDE WITH A LOW-REFRACTIVE-INDEX BUFFER LAYER
KITAJIMA, H
FUJITA, K
OPTICS LETTERS, 1981, 6 (08) : 392 - 394

← 1 2 3 4 5 →