Asymmetric Backscattering of Ultraviolet Light by Low-Refractive Index Thin Film of Tilted Alumina Nanorods

被引：0
|
作者：
Yan, Xing [1 ]
Natarajan, Kamaraju [2 ]
Saxena, Tanuj [2 ]
Shur, Michael S. [1 ,2 ]
机构：
[1] Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, Troy, NY 12180 USA
[2] Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12180 USA
来源：
2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2013年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Asymmetric backscattering was observed at 266 nm for tilted alumina nanorods array. Novel approach for modeling of light scattering by nanoporous films was proposed and was shown to be in good agreement with measured data.
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