Introduction to the special issue on Mutation Testing

被引：2
|
作者：
Jia, Yue [1 ]
Harman, Mark [1 ]
Merayo, Mercedes [2 ]
机构：
[1] UCL, Dept Comp Sci, CREST, London WC1E 6BT, England
[2] Univ Complutense Madrid, Dept Sistemas Informat & Computac, Madrid, Spain
来源：
SOFTWARE TESTING VERIFICATION & RELIABILITY | 2015年 / 25卷 / 5-7期
基金：
英国工程与自然科学研究理事会;
关键词：
D O I：
10.1002/stvr.1582
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
引用
收藏
页码：461 / 463
页数：3
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