Introduction to the special issue on Mutation Testing

被引：2

作者：

Jia, Yue ^{[1
]}

Harman, Mark ^{[1
]}

Merayo, Mercedes ^{[2
]}

机构：

[1] UCL, Dept Comp Sci, CREST, London WC1E 6BT, England

[2] Univ Complutense Madrid, Dept Sistemas Informat & Computac, Madrid, Spain

来源：

SOFTWARE TESTING VERIFICATION & RELIABILITY | 2015年 / 25卷 / 5-7期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1002/stvr.1582

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

引用

页码：461 / 463

页数：3

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