Investigation of hexadecanethiol self-assembled monolayers on cadmium tin oxide thin films

被引：6
|
作者：
Rhodes, Cnissy L. [1 ]
Brewer, Scott H. [1 ]
Folmer, Jaap [1 ]
Franzen, Stefan [1 ]
机构：
[1] N Carolina State Univ, Dept Chem, Raleigh, NC 27695 USA
来源：
THIN SOLID FILMS | 2008年 / 516卷 / 08期
关键词：
plasma frequency; surface plasmon; conducting thin film; Fourier-transform infrared spectroscopy;
D O I：
10.1016/j.tsf.2007.08.098
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This study reports the use of variable angle reflectance Fourier transform infrared spectroscopy and X-ray photoelectron spectroscopy to investigate the formation of a 1-hexadecanethiol adlayer on cadmium tin oxide (CTO) thin film surfaces. These adlayers appear to be robust, ordered monolayers. The optical and electronic properties of CTO thin films chemically vapor deposited onto glass substrates were also investigated. The reflectance of the CTO films was dependent upon the incident angle of the impinging radiation and revealed a reflectance decrease indicative of a plasma frequency in the mid-IR using p-polarized radiation. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：1838 / 1842
页数：5
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