Runs-rules;
DEWMA X control chart;
enhanced scheme;
asymptotic control limits;
exact control limits;
quality loss function;
PERFORMANCE;
D O I:
10.1080/16843703.2018.1560603
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Enhancing the sensitivity of control charts for detecting small process shift is desirable and may be done in different ways. In this paper, we propose the double exponentially weighted moving average (DEWMA) control chart using the 2-of-2 and 1-of-1 or 2-of-2 runs-rules schemes for monitoring process mean shifts. The performances of the resulting control schemes are investigated in terms of the average run-length (), standard deviation of the run-length () and selective percentiles of the run-length (). In addition, the overall performance of the proposed runs-rules charts are examined and compared with those of the existing charts in terms of the , average extra quadratic loss (), average ratio of the average run-length () and performance comparison index () values. It is observed that the proposed control schemes are more efficient in many situations and improve the ability of the existing DEWMA schemes in detecting small, moderate and large mean shifts.
机构:
Augusta Univ, Dept Populat Hlth Sci, Div Biostat & Data Sci, Augusta, GA USAAugusta Univ, Dept Populat Hlth Sci, Div Biostat & Data Sci, Augusta, GA USA
Chatterjee, Kashinath
Koukouvinos, Christos
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机构:
Natl Tech Univ Athens, Dept Math, Athens 15773, GreeceAugusta Univ, Dept Populat Hlth Sci, Div Biostat & Data Sci, Augusta, GA USA
Koukouvinos, Christos
Lappa, Angeliki
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机构:
Natl Tech Univ Athens, Dept Math, Athens 15773, GreeceAugusta Univ, Dept Populat Hlth Sci, Div Biostat & Data Sci, Augusta, GA USA