Time-domain measurements of the dangling bond spin-lattice relaxation in hydrogenated amorphous silicon-germanium alloys

被引:3
|
作者
Malten, C
Finger, F
Wagner, H
机构
[1] Inst. fur Schicht und Ionentechnik, Forschungszentrum Jülich
关键词
disordered systems; electronic states (localized); spin-orbit effects; electron paramagnetic resonance;
D O I
10.1016/0038-1098(96)00360-2
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The dangling bond spin relaxation times in a-Si:Ge:H alloys are determined with pulse electron spin resonance techniques as a function of alloy composition and temperature. Over a wide alloy range two spin lattice relaxation components are detected in saturation recovery measurements. The two components are attributed to Si- and Ge- dangling bond states. It is found that the respective relaxation times, which in the pure alloys are different by two orders of magnitude due to the difference in the spin orbit coupling of Si and Ge, both gradually change with alloy composition but maintain largely different values also in the alloys. As a function of temperature the relaxation times decrease as T--m (m approximate to 2). Copyright (C) 1996 Published by Elsevier Science Ltd
引用
收藏
页码:503 / 507
页数:5
相关论文
共 50 条
  • [41] EFFECT OF ION-BOMBARDMENT ON THE GROWTH AND PROPERTIES OF HYDROGENATED AMORPHOUS SILICON-GERMANIUM ALLOYS
    PERRIN, J
    TAKEDA, Y
    HIRANO, N
    MATSUURA, H
    MATSUDA, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (01): : 5 - 11
  • [42] Structural relaxation of amorphous silicon-germanium alloys: Molecular-dynamics study
    Ishimaru, M., 1600, Japan Society of Applied Physics (43):
  • [43] Structural relaxation of amorphous silicon-germanium alloys: Molecular-dynamics study
    Ishimaru, M
    Yamaguchi, M
    Hirotsu, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (12): : 7966 - 7970
  • [44] Femtosecond far-infrared studies of carrier dynamics in hydrogenated amorphous silicon and silicon-germanium alloys
    Nampoothiri, AVV
    Nelson, BP
    Dexheimer, SL
    AMORPHOUS AND NANOCRYSTALLINE SILICON-BASED FILMS-2003, 2003, 762 : 333 - 337
  • [45] ELECTRON-DRIFT-MOBILITY MEASUREMENTS AND EXPONENTIAL CONDUCTION-BAND TAILS IN HYDROGENATED AMORPHOUS SILICON-GERMANIUM ALLOYS
    WANG, Q
    ANTONIADIS, H
    SCHIFF, EA
    GUHA, S
    PHYSICAL REVIEW B, 1993, 47 (15): : 9435 - 9448
  • [46] PROTON SPIN-LATTICE RELAXATION TIME MEASUREMENTS IN STARCH
    ADAMIC, K
    BLINC, M
    JOURNAL OF POLYMER SCIENCE PART B-POLYMER LETTERS, 1968, 6 (4PB): : 303 - &
  • [47] NUCLEAR SPIN-LATTICE RELAXATION TIME MEASUREMENTS FOR IMPURITIES IN FERROMAGNETIC ALLOYS BY NUCLEAR ORIENTATION
    REID, PGE
    SOTT, M
    STONE, NJ
    PHYSICS LETTERS A, 1967, A 25 (06) : 456 - &
  • [48] Electronic properties of hydrogenated amorphous silicon-germanium alloys and long-range potential fluctuations
    Sheng, SR
    Sun, GS
    Liebe, J
    Kattwinkel, A
    Braunstein, R
    Nelson, BP
    von Roedern, B
    Bärner, K
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2002, 325 (1-2): : 490 - 496
  • [49] ELECTRON-SPIN-LATTICE RELAXATION IN AMORPHOUS-SILICON AND GERMANIUM
    STUTZMANN, M
    BIEGELSEN, DK
    PHYSICAL REVIEW B, 1983, 28 (11): : 6256 - 6261
  • [50] Effects of light induced degradation on the distribution of deep defects in hydrogenated amorphous silicon-germanium alloys
    Chen, CC
    Zhong, F
    Cohen, JD
    AMORPHOUS SILICON TECHNOLOGY - 1996, 1996, 420 : 581 - 586