In situ characterization of surfaces at high temperature by using simultaneously a pyroreflectometer and an X-ray diffractometer

被引：1

作者：

Llauro, G ^{[1
]}

Hernandez, D ^{[1
]}

Sibieude, F ^{[1
]}

Gineste, JM ^{[1
]}

Verges, R ^{[1
]}

Antoine, D ^{[1
]}

机构：

[1] CNRS, IMP, F-66125 Font Romeu, France

来源：

APPLIED SURFACE SCIENCE | 1998年 / 135卷 / 1-4期

关键词：

high temperature oxidation; optical fiber pyroreflectometer; X-ray diffraction;

D O I：

10.1016/S0169-4332(98)00260-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

An optical fiber pyroreflectometer was adapted to an X-ray diffraction (XRD) high temperature chamber, in order to analyse and control in situ the thermoradiative properties and the temperature of the sample simultaneously examined by XRD. The modifications accompanying the high temperature oxidation of two different materials: TiO2-x plates and CVD (Ti, Si, N) coatings were chosen as illustrating examples. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：91 / 96

页数：6

共 50 条

[41] A 'static' high-resolution X-ray diffractometer
Fewster, PF
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2005, 38 : 62 - 68
[42] AN AUTOMATIC X-RAY DIFFRACTOMETER
BROWN, PJ
ACTA CRYSTALLOGRAPHICA, 1960, 13 (12): : 985 - 985
[43] X-RAY DIFFRACTOMETER FURNACE
WILCHINS.ZW
TSIEN, HC
VERSTRAT.G
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (SEP): : 704 - &
[44] MONOCHROMATIZATION ON THE X-RAY DIFFRACTOMETER
BROLL, N
ANALUSIS, 1983, 11 (01) : 36 - 41
[45] Adjusting an x-ray diffractometer
1600, (55):
[46] A DIFFRACTOMETER FOR X-RAY INTERFEROMETRY
SPIEKER, P
ANDO, M
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3): : 609 - 611
[47] ADAPTATION OF A GEIGER-COUNTER X-RAY DIFFRACTOMETER FOR HIGH-TEMPERATURE INVESTIGATIONS
CHIOTTI, P
REVIEW OF SCIENTIFIC INSTRUMENTS, 1954, 25 (07): : 683 - 688
[48] Design optimization of a high-temperature X-ray diffractometer for in-situ determination of lattice mismatch and residual stress - the Hotbird
Margaça, F.M.A.
Pinhão, N.R.
Sequeira, A.D.
Materials Science Forum, 2000, 321
[49] DETERMINATION OF CRYSTALLOGRAPHIC TEXTURE USING AN X-RAY DIFFRACTOMETER
LAINER, DI
RADISHEV.AI
SOLLERTI.ES
INDUSTRIAL LABORATORY, 1970, 36 (01): : 39 - &
[50] Design optimisation of a high-temperature X-ray diffractometer for in-situ determination of lattice mismatch and residual stress -: the Hotbird
Margaça, FMA
Pinhao, NR
Sequeira, AD
EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2000, 321-3 : 168 - 173

← 1 2 3 4 5 →