In situ characterization of surfaces at high temperature by using simultaneously a pyroreflectometer and an X-ray diffractometer

被引：1
|
作者：
Llauro, G [1 ]
Hernandez, D [1 ]
Sibieude, F [1 ]
Gineste, JM [1 ]
Verges, R [1 ]
Antoine, D [1 ]
机构：
[1] CNRS, IMP, F-66125 Font Romeu, France
来源：
APPLIED SURFACE SCIENCE | 1998年 / 135卷 / 1-4期
关键词：
high temperature oxidation; optical fiber pyroreflectometer; X-ray diffraction;
D O I：
10.1016/S0169-4332(98)00260-8
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
An optical fiber pyroreflectometer was adapted to an X-ray diffraction (XRD) high temperature chamber, in order to analyse and control in situ the thermoradiative properties and the temperature of the sample simultaneously examined by XRD. The modifications accompanying the high temperature oxidation of two different materials: TiO2-x plates and CVD (Ti, Si, N) coatings were chosen as illustrating examples. (C) 1998 Elsevier Science B.V. All rights reserved.
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页码：91 / 96
页数：6
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