How can the results of silicon debug justify the investment in Design-for-Debug Infrastructure?

被引：0
|
作者：
Gottlieb, Bob [1 ]
机构：
[1] Intel Corp, Santa Clara, CA 95052 USA
来源：
2007 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2 | 2007年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
With the increase in clock domains and multicore designs, the impact of adding traditional debug features is becoming prohibitive.. The impact is mainly in restrictions in device operation and increased risk to the design itself It is no longer a given that these features pay for themselves in terms of benefit to silicon debug and test.
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页码：1030 / 1030
页数：1
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