Design-for-debug to address next-generation SoC debug concerns

被引：0
|
作者：
Vermeulen, Bart [1 ]
机构：
[1] NXP Semicond, Corp Innovat & Technol Res, NL-5656 AE Eindhoven, Netherlands
来源：
2007 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2 | 2007年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1031 / 1031
页数：1
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