Research on Noise Sources in CMOS Image Sensors

被引：1

作者：

Han, Baoyuan ^{[1
]}

Shang, Yuanyuan ^{[2
]}

Zhao, Xiaoxu ^{[1
]}

Liu, Hui ^{[1
]}

机构：

[1] Capital Normal Univ, Coll Informat Engn, Beijing, Peoples R China

[2] Capital Normal Univ, Beijing Engn Res Ctr High Reliable Embedded Syst, Beijing, Peoples R China

来源：

MICRO NANO DEVICES, STRUCTURE AND COMPUTING SYSTEMS | 2011年 / 159卷

基金：

中国国家自然科学基金;

关键词：

CMOS APS; CMOS PPS; Sensor; Noise; CCD;

D O I：

10.4028/www.scientific.net/AMR.159.527

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

CMOS (Complementary Metal Oxide Semiconductor) imagers as a solid state array develop rapidly. This article introduces various types of CMOS image sensors' noises in detail, the cause of each noise, as well as a brief overview of current methods for reducing different noise.

引用

页码：527 / +

页数：2

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