Research on Noise Sources in CMOS Image Sensors

被引：1
|
作者：
Han, Baoyuan [1 ]
Shang, Yuanyuan [2 ]
Zhao, Xiaoxu [1 ]
Liu, Hui [1 ]
机构：
[1] Capital Normal Univ, Coll Informat Engn, Beijing, Peoples R China
[2] Capital Normal Univ, Beijing Engn Res Ctr High Reliable Embedded Syst, Beijing, Peoples R China
来源：
MICRO NANO DEVICES, STRUCTURE AND COMPUTING SYSTEMS | 2011年 / 159卷
基金：
中国国家自然科学基金;
关键词：
CMOS APS; CMOS PPS; Sensor; Noise; CCD;
D O I：
10.4028/www.scientific.net/AMR.159.527
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
CMOS (Complementary Metal Oxide Semiconductor) imagers as a solid state array develop rapidly. This article introduces various types of CMOS image sensors' noises in detail, the cause of each noise, as well as a brief overview of current methods for reducing different noise.
引用
收藏
页码：527 / +
页数：2
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