Special Issue: Special Issue on the Eighth IEEE International On-Line Testing Workshop (IOLTW'02)

被引：0

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作者：

Agrawal, VD

机构：

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2003年 / 19卷 / 05期

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D O I：

10.1023/A:1025108727093

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：495 / 495

页数：1

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