Special Issue: Special Issue on the Eighth IEEE International On-Line Testing Workshop (IOLTW'02)

被引：0
|
作者：
Agrawal, VD
机构：
来源：
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2003年 / 19卷 / 05期
关键词：
D O I：
10.1023/A:1025108727093
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：495 / 495
页数：1
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