Effect of resistivity on small edge localized mode

被引：10

作者：

Wu, N. ^{[1
,2
]}

Chen, S. Y. ^{[1
,2
]}

Mou, M. L. ^{[1
,2
]}

Tang, C. J. ^{[1
,2
]}

机构：

[1] Sichuan Univ, Coll Phys Sci & Technol, Chengdu 610064, Sichuan, Peoples R China

[2] Sichuan Univ, Key Lab High Energy Dens Phys & Technol, Minist Educ, Chengdu 610064, Sichuan, Peoples R China

来源：

PHYSICS OF PLASMAS | 2018年 / 25卷 / 09期

基金：

中国国家自然科学基金;

关键词：

ALCATOR C-MOD; TRANSPORT; PEDESTAL; REGIME;

D O I：

10.1063/1.5038042

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

The effect of resistivity on small edge localized mode (ELM) is investigated based on the peeling-ballooning three-field module of BOUT++. The ELM size increases with increasing resistivity, which is attributed to both linear growth rate and turbulence intensity. In the high resistivity case, a large linear growth rate causes a fierce initial collapse of pedestal, and the short duration of the zonal flow results in weak turbulence suppression, leading to more additional energy loss in the turbulence transport phase. This work is expected to provide some reference on understanding small ELM. Published by AIP Publishing.

引用

页数：9

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