Buried channel MOSFET DC SPICE modeling using surface channel models

被引:0
|
作者
Kulas, M [1 ]
Nathan, A [1 ]
Weale, G [1 ]
机构
[1] Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we review the various methods available for modeling DC behaviour of buried channel metal oxide semiconductor transistors in SPICE. A surface channel model is used to predict the buried channel device DC behaviour, and an equivalent circuit using the fitted surface channel model is presented.
引用
收藏
页码:445 / 448
页数:4
相关论文
共 50 条
  • [1] BURIED-CHANNEL MOSFET MODEL FOR SPICE
    VANDERTOL, MJ
    CHAMBERLAIN, SG
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1991, 10 (08) : 1015 - 1035
  • [2] CHARACTERISTICS OF SHORT-CHANNEL MOSFET WITH BURIED CHANNEL
    STOEV, IG
    DOKLADI NA BOLGARSKATA AKADEMIYA NA NAUKITE, 1985, 38 (07): : 855 - 857
  • [3] AC and DC characterization and spice modeling of short channel polysilicon TFTs
    Jacunski, MD
    Shur, MS
    Ytterdal, T
    Owusu, AA
    Hack, M
    FLAT PANEL DISPLAY MATERIALS II, 1997, 424 : 213 - 218
  • [4] THERMAL NOISE IN BURIED-CHANNEL MOSFET
    GOLDMINZ, L
    NEMIROVSKY, Y
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (10) : 2325 - 2332
  • [5] DEVICE MODEL FOR AN ION-IMPLANTED BURIED CHANNEL MOSFET AND BURIED-CHANNEL CCD
    TAYLOR, GW
    CHATTERJEE, PK
    CHAO, HH
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (11) : 1353 - 1353
  • [7] Molecular control of the drain current in a buried channel MOSFET
    Yang, Jinman
    de la Garza, L.
    Thornton, T. J.
    Kozicki, M.
    Gust, D.
    ICCN 2002: INTERNATIONAL CONFERENCE ON COMPUTATIONAL NANOSCIENCE AND NANOTECHNOLOGY, 2002, : 318 - 321
  • [8] Computation of effective mobility in buried channel heterostructure MOSFET
    Kar, GS
    Maikap, S
    Ray, SK
    Chakrabarti, NB
    PROCEEDINGS OF THE ELEVENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOL 1 & 2, 2002, 4746 : 874 - 877
  • [9] Molecular control of the drain current in a buried channel MOSFET
    Laws, GM
    Thornton, TJ
    Yang, JM
    de la Garza, L
    Kozicki, M
    Gust, D
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2002, 233 (01): : 83 - 89
  • [10] Extraction of channel carrier concentration using C-V method for SiC buried-channel MOSFET
    Gao Jin-Xia
    Zhang Yi-Men
    Tang Xiao-Yan
    Zhang Yu-Ming
    ACTA PHYSICA SINICA, 2006, 55 (06) : 2992 - 2996