Electron and hole scattering in short-period InGaAs/InP superlattices

被引:1
|
作者
Pusep, Yu. A. [1 ]
Gold, A. [2 ,3 ]
Mamani, N. C. [1 ]
de Godoy, M. P. F. [4 ]
Galvao Gobato, Y. [4 ]
LaPierre, R. R. [5 ]
机构
[1] Univ Sao Paulo, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP, Brazil
[2] Univ Toulouse 3, UFR PCA, F-31062 Toulouse, France
[3] CEMES CNRS, F-31062 Toulouse, France
[4] Univ Fed Sao Carlos, Dept Fis, BR-13565905 Sao Carlos, SP, Brazil
[5] McMaster Univ, Dept Engn Phys, Ctr Emerging Device Technol, Hamilton, ON L8S 4L7, Canada
基金
巴西圣保罗研究基金会; 加拿大自然科学与工程研究理事会;
关键词
PARTICLE RELAXATION-TIME; QUANTUM-WELLS; SINGLE-PARTICLE; ROUGHNESS SCATTERING; TRANSPORT-PROPERTIES; INTERFACE ROUGHNESS; GAS; MOBILITY; SPECTROSCOPY; PARAMETERS;
D O I
10.1063/1.3646365
中图分类号
O59 [应用物理学];
学科分类号
摘要
The combination of photoluminescence and magneto-transport measurements is used to study the single-particle relaxation time and the transport scattering time in short-period InGaAs/InP superlattices. Both the single-particle relaxation times of the electrons and of the holes were obtained in the same samples and were shown to be determined by the remote-impurity scattering. The transport scattering time for electrons was found to be dominated by the interface-roughness scattering with lateral length A = 10 nm and height Delta =0.13 nm. We also discuss the importance of multiple-scattering effects for small well widths and of alloy scattering for large well widths. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3646365]
引用
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页数:6
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