Ba4Ti12O27:: Rietveld refinement using X-ray powder diffraction data

被引：11
|
作者：
Currao, A [1 ]
机构：
[1] Kyushu Natl Ind Res Inst, Tosu, Saga 8410052, Japan
来源：
ACTA CRYSTALLOGRAPHICA SECTION C-CRYSTAL STRUCTURE COMMUNICATIONS | 1999年 / 55卷
关键词：
D O I：
10.1107/S0108270198010919
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The title compound is a new mixed-valence barium titanate ((Ba4Ti2Ti10O27)-Ti-II-Ti-III-O-IV). A refinement using X-ray powder data was carried out using the Rietveld method, with the lattice parameters and atomic sites of the isostructural compound Ba4Al2Ti10O27 as a starting model.
引用
收藏
页码：2 / 4
页数：3
相关论文
共 50 条
  • [21] THE RIETVELD STRUCTURE REFINEMENT OF THE EPIDOTE CRYSTALS FROM BUCEGI CONGLOMERATES (ROMANIA) USING X-RAY POWDER DIFFRACTION DATA
    Ciocirdel, Mihai
    Branoiu, Gheorghe Adrian
    [J]. GEOCONFERENCE ON SCIENCE AND TECHNOLOGIES IN GEOLOGY, EXPLORATION AND MINING, SGEM 2013, VOL I, 2013, : 209 - 216
  • [22] Reliability of the structural data for calcite and dolomite extracted from X-ray powder diffraction by Rietveld refinement
    Liu, Shanke
    Li, He
    Liu, Jianming
    [J]. PERIODICO DI MINERALOGIA, 2014, 83 (01): : 121 - 140
  • [23] THE RIETVELD STRUCTURE REFINEMENT OF THE SELENITE GYPSUM FROM VALEA REA (ROMANIA) USING X-RAY POWDER DIFFRACTION DATA
    Branoiu, Gheorghe Adrian
    [J]. 12th International Multidisciplinary Scientific Geoconference, SGEM 2012, Vol. I, 2012, : 363 - 368
  • [24] Synthesis, crystal structure and physical properties of Ba4Ti12O27
    Kataoka, Kunimitsu
    Hayakawa, Hiroshi
    Iyo, Akira
    Ken-ichi, Ohshima
    Akimoto, Junji
    [J]. ELECTROCERAMICS IN JAPAN XV, 2013, 566 : 211 - 214
  • [25] Crystal structure refinement of Ba5Nb4O15-x and Ba5Nb4O15-x by rietveld analysis of neutron and X-ray diffraction data
    Pagola, S
    Polla, G
    Leyva, G
    Casais, MT
    Alonso, JA
    Rasines, I
    Carbonio, RE
    [J]. EUROPEAN POWDER DIFFRACTION: EPDIC IV, PTS 1 AND 2, 1996, 228 : 819 - 824
  • [26] Crystal structure refinement of Ba5Nb4O15 and Ba5Nb4O15-x by Rietveld analysis of neutron and x-ray diffraction data
    Pagola, S.
    Polla, G.
    Leyva, G.
    Casais, M.T.
    Alonso, J.A.
    Rasines, I.
    Carbonio, R.E.
    [J]. Materials Science Forum, 1996, 228-231 (pt 2) : 819 - 824
  • [27] KYHP3O10:: Rietveld refinement using X-ray powder diffraction data and Raman study of the conductivity phase transition
    Zouari, N
    Hadrich, A
    Mhiri, T
    Daoud, A
    Gravereau, P
    [J]. JOURNAL OF MOLECULAR STRUCTURE, 2002, 604 (2-3) : 101 - 111
  • [28] Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
    Yong-Il Kim
    Won Bin Im
    Duk Young Jeon
    [J]. Journal of Materials Science, 2006, 41 : 1643 - 1647
  • [29] Combined Rietveld refinement of BaMgAl10O17:Eu2+ using X-ray and neutron powder diffraction data
    Kim, YI
    Kim, KB
    Jung, MJ
    Hong, JS
    [J]. JOURNAL OF LUMINESCENCE, 2002, 99 (02) : 91 - 100
  • [30] Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
    Kim, YI
    Im, WB
    Jeon, DY
    [J]. JOURNAL OF MATERIALS SCIENCE, 2006, 41 (05) : 1643 - 1647
12345