Influence of atomic force microscope cantilever tilt and induced torque on force measurements

被引：42

作者：

Edwards, Scott A. ^{[1
]}

Ducker, William A. ^{[2
]}

Sader, John E. ^{[1
]}

机构：

[1] Univ Melbourne, Dept Math & Stat, Melbourne, Vic 3010, Australia

[2] Univ Melbourne, Dept Chem & Biomol Engn, Melbourne, Vic 3010, Australia

来源：

JOURNAL OF APPLIED PHYSICS | 2008年 / 103卷 / 06期

关键词：

D O I：

10.1063/1.2885734

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Quantitative force measurements performed using the atomic force microscope (AFM) inherently rely on calibration of the AFM cantilever spring constant to convert the measured deflection into a force. Here, we examine the effect of cantilever tilt and induced torque on the effective normal spring constant resulting from variable placement of the tip probe, as is frequently encountered in practice. Explicit general formulas are presented that account for these combined effects for both sharp tips and spherical probes. In contrast to previous studies, we find that induced tip torque can act to either enhance or reduce the effective normal spring constant of the cantilever. The implications of this study to practical force measurements are discussed. c 2008 American Institute of Physics.

引用

页数：6

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