Research on vibration of piezoelectric micro cantilever in atomic force microscope

被引：0

|

作者：

Harbin Institute of Technology, Harbin 150001, China ^{[1
]}

机构：

来源：

J Vib Shock | 2006年 / 5卷 / 183-185期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

收藏

相关论文

共 50 条

[1] A signal preamplifier of the piezoelectric vibration transducer of the cantilever of an atomic-force microscope
Kazantsev, DV
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2005, 48 (06) : 807 - 812
[2] A Signal Preamplifier of the Piezoelectric Vibration Transducer of the Cantilever of an Atomic-Force Microscope
D. V. Kazantsev
Instruments and Experimental Techniques, 2005, 48 : 807 - 812
[3] Active Piezoelectric Shunt Control of an Atomic Force Microscope Micro-Cantilever
Fairbairn, Matthew W.
Mueller, Philipp
Moheimani, S. O. Reza
2013 3RD AUSTRALIAN CONTROL CONFERENCE (AUCC), 2013, : 257 - 262
[4] Application of piezoelectric micro-cantilever to atom force microscope
Xi'an Jiaotong Univ, Xi'an, China
Yadian Yu Shengguang, 4 (245-249):
[5] Vibration frequency and sensitivity of an atomic force microscope cantilever with a crack
Lee, Haw-Long
Yang, Yu-Ching
Chang, Win-Jin
Journal of Computational and Theoretical Nanoscience, 2015, 12 (11) : 4329 - 4334
[6] Quality Factor Enhancement of an Atomic Force Microscope Micro-cantilever Using Piezoelectric Shunt Control
Fairbairn, Matthew W.
Moheimani, S. O. Reza
2012 IEEE/ASME INTERNATIONAL CONFERENCE ON ADVANCED INTELLIGENT MECHATRONICS (AIM), 2012, : 556 - 561
[7] Micro-fabricated piezoelectric cantilever for atomic force microscopy
Watanabe, S
Fujii, T
REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (11): : 3898 - 3903
[8] A vibration analysis of a cracked micro-cantilever in an atomic force microscope by using transfer matrix method
Dastjerdi, Shahriar
Abbasi, Mohammad
ULTRAMICROSCOPY, 2019, 196 : 33 - 39
[9] A new model for investigating the flexural vibration of an atomic force microscope cantilever
Abbasi, Mohammad
Mohammadi, Ardeshir Karami
ULTRAMICROSCOPY, 2010, 110 (11) : 1374 - 1379
[10] Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt control
Fairbairn, M.
Moheimani, S. O. R.
REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (05):

← 1 2 3 4 5 →