On determining dead layer and detector thicknesses for a position-sensitive silicon detector

被引：15

作者：

Manfredi, J. ^{[1
,2
]}

Lee, Jenny ^{[3
]}

Lynch, W. G. ^{[1
,2
]}

Niu, C. Y. ^{[1
,2
,4
,5
]}

Tsang, M. B. ^{[1
,2
]}

Anderson, C. ^{[1
,2
]}

Barney, J. ^{[1
,2
]}

Brown, K. W. ^{[1
,2
]}

Chajecki, Z. ^{[6
]}

Chan, K. P. ^{[1
,2
,7
]}

Chen, G. ^{[6
]}

Estee, J. ^{[1
,2
]}

Li, Z. ^{[4
,5
]}

Pruitt, C. ^{[8
]}

Rogers, A. M. ^{[9
]}

Sanetullaev, A. ^{[1
,2
]}

Setiawan, H. ^{[1
,2
]}

Showalter, R. ^{[1
,2
]}

Tsang, C. Y. ^{[1
,2
]}

Winkelbauer, J. R. ^{[1
,2
]}

Xiao, Z. ^{[10
]}

Xu, Z. ^{[3
]}

机构：

[1] Michigan State Univ, NSCL, E Lansing, MI 48824 USA

[2] Michigan State Univ, Dept Phys & Astron, E Lansing, MI 48824 USA

[3] Univ Hong Kong, Dept Phys, Pokfulam Rd, Hong Kong, Hong Kong, Peoples R China

[4] Peking Univ, Sch Phys, Beijing 100871, Peoples R China

[5] Peking Univ, State Key Lab Nucl Phys & Technol, Beijing 100871, Peoples R China

[6] Western Michigan Univ, Dept Phys, Kalamazoo, MI 49008 USA

[7] Chinese Univ Hong Kong, Dept Phys, Shatin, Hong Kong, Peoples R China

[8] Washington Univ, Dept Chem, St Louis, MO 63130 USA

[9] Univ Massachusetts Lowell, Dept Phys, Lowell, MA 01854 USA

[10] Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2018年 / 888卷

基金：

美国国家科学基金会;

关键词：

Silicon detectors; Dead layer; Pin source; Alpha source calibration; Si-CsI calibration; IDENTIFICATION; RESOLUTION; ARRAY;

D O I：

10.1016/j.nima.2017.12.082

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this work, two particular properties of the position-sensitive, thick silicon detectors (known as the "E'' detectors) in the High Resolution Array (HiRA) are investigated: the thickness of the dead layer on the front of the detector, and the overall thickness of the detector itself. The dead layer thickness for each E detector in HiRA is extracted using a measurement of alpha particles emitted from a(212)Pb pin source placed close to the detector surface. This procedure also allows for energy calibrations of the E detectors, which are otherwise inaccessible for alpha source calibration as each one is sandwiched between two other detectors. The E detector thickness is obtained from a combination of elastically scattered protons and an energy-loss calculation method. Results from these analyses agree with values provided by the manufacturer. (C) 2018 Elsevier B.V. All rights reserved.

引用

页码：177 / 183

页数：7

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