X-Band Power and Linearity Performance of Compositionally Graded AlGaN Channel Transistors

被引:35
|
作者
Sohel, Shahadat H. [1 ]
Xie, Andy [2 ]
Beam, Edward [2 ]
Xue, Hao [1 ]
Roussos, Jason A. [3 ]
Razzak, Towhidur [1 ]
Bajaj, Sanyam [1 ]
Cao, Yu [2 ]
Meyer, David J. [3 ]
Lu, Wu [1 ]
Rajan, Siddharth [1 ]
机构
[1] Ohio State Univ, Elect & Comp Engn Dept, Columbus, OH 43210 USA
[2] Qorvo Inc, Richardson, TX 75081 USA
[3] Naval Res Lab, Washington, DC 20375 USA
关键词
Transistor linearity; graded channel AlGaN; PolFET; polarization-graded field-effect transistor; two-tone linearity;
D O I
10.1109/LED.2018.2874443
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on the power and linearity performance of metal organic chemical vapor deposition grown AlGaN channel polarization-graded field-effect transistor (PolFET). The fabricated transistors with 3-D electron channels showed nearly flat transconductanceprofiles. Maximum f(T) and f(max) of 23 and 65 GHz were measured for 0.7-mu m gate-length transistors, corresponding to an f(T)-L-G product of 16.2 GHz.mu m. Load-pull measurement at 10 GHz revealed a maximumoutput power of 2 W/mm with a maximum small signal gain of 16 dB. Two-tone measurement at 10 GHz showed an OIP3 of 33 dBm for 150-mu m device width and a corresponding linearity figure-of-merit OIP3/P-DC of 3.4 dB. These results suggest that PolFETs could be useful for high-frequency applications requiring high linearity.
引用
收藏
页码:1884 / 1887
页数:4
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