Evaluation of ADC testing systems using ADC transfer standard

被引：3

作者：

Haasz, V ^{[1
]}

Roztocil, J ^{[1
]}

Slepicka, D ^{[1
]}

机构：

[1] Czech Tech Univ, Fac Elect Engn, Dept Measurement, CZ-16627 Prague, Czech Republic

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2005年 / 54卷 / 03期

关键词：

analog-to-digital converter (ADC) testing; analog-to-digital (AD) transfer standard; comparative measurements; ENOB; frequency spectrum averaging; generator instability; SINAD; THD;

D O I：

10.1109/TIM.2005.847119

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A transportable high-stability reference AD device was designed and built to compare the systems for testing the dynamic quality of analog-to-digital converters (ADCs) or analog-to-digital (AD) modules. Three different input modules can be used in the frequency range up to 5 MHz. First, this paper refers to the results of an AD device application in the frequency range of the testing signal up to 100 kHz, where four ADC testing systems were compared in different laboratories, and a short time amplitude and/or frequency instability of testing signal generators was evaluated. Second, it describes the first experience of its application in the frequency range from 100-5 MHz.

引用

页码：1150 / 1155

页数：6

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