共 50 条
- [22] Neural networks based test generation algorithm for combinational logic circuits Harbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology, 2002, 34 (02): : 255 - 257
- [24] Neural network model of logic functions and its application in circuit test generation CAD/ GRAPHICS TECHNOLOGY AND ITS APPLICATIONS, PROCEEDINGS, 2003, : 345 - 346
- [25] Interface adaptor logic - A new model for interfacing peripherals in IP based designs 2004 IEEE INTERNATIONAL CONFERENCE ON FIELD-PROGRAMMABLE TECHNOLOGY, PROCEEDINGS, 2004, : 331 - 334
- [26] Energy model based macrocell placement for wirelength minimization 17TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: DESIGN METHODOLOGIES FOR THE GIGASCALE ERA, 2004, : 713 - 716
- [27] Test Generation for Model Based Fieldbus Profiles 2012 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY (ICIT), 2012, : 682 - 687