SoC: Simulation and damping of power supply noise

被引:0
|
作者
Rauscher, J [1 ]
Pfleiderer, HJ [1 ]
机构
[1] Univ Ulm, Dept Microelect, D-89081 Ulm, Germany
关键词
simultaneous switching noise; delta I-noise; power integrity;
D O I
10.1117/12.582345
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The analysis of full-chip IR and di/dt drop as well as package and on-chip resonance is very important for the system-on-chip design. Algorithms to optimize power distribution networks (PDNs) iteratively require fast methods to estimate the power supply noise. Additionally an efficient way to provide the complex input data for such a simulation is required. The simulation method used is based on a macromodel of the off-chip power supply and a 2D signal line model of the on-chip PDN. The on-chip PDN gets discretized in 2D signal line cells. We use admittance functions in each direction instead of resistances and inductances for these cells. Therefore, the frequency dependence due to the multiple return paths in different layers and further high frequency effects can be incorporated. One of the merits of this approach is that these admittance functions, which may vary all over the chip, can be efficiently calculated with a model order reduction algorithm directly from a Partial Element Equivalent Circuit (PEEC) model. The currents of the nonlinear devices are modeled as time varying current sources in parallel to capacitances and conductances. We use a fast transient simulation algorithm closely related to the Finite-Difference Time-Domain schemes to simulate the model. The method is well suited for iterative design improvements and irregular power grids. Combining the macromodel of the off-chip PDN with the reduced order model of the IC we investigate the effect of damping resistors and the possibility to optimize the power integrity, by increasing the damping resistors.
引用
收藏
页码:85 / 92
页数:8
相关论文
共 50 条
  • [1] SoC Test Architecture Design and Optimization Considering Power Supply Noise Effects
    Yuan, Feng
    Xu, Qiang
    [J]. 2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2008, : 666 - 674
  • [2] SOC Power Off - Power Noise Analysis
    Kee, Yong Lee
    [J]. 2009 INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC 2009), 2009, : 220 - 223
  • [3] Smart Power Supply for FPGA/SoC
    Plattner, Markus
    Fassi, Chedi
    Berner, Aron
    [J]. 2023 13TH EUROPEAN SPACE POWER CONFERENCE, ESPC, 2023,
  • [4] High-level simulation of substrate noise generation including power supply noise coupling
    van Heijningen, M
    Badaroglu, M
    Donnay, S
    Engels, M
    Bolsens, I
    [J]. 37TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2000, 2000, : 446 - 451
  • [5] Piezoelectric shunt damping of a circular saw blade with autonomous power supply for noise and vibration reduction
    Pohl, Martin
    Rose, Michael
    [J]. JOURNAL OF SOUND AND VIBRATION, 2016, 361 : 20 - 31
  • [6] Simulation-based Analysis of FF Behavior in Presence of Power Supply Noise
    Miura, Yukiya
    Yamamoto, Takuya
    [J]. 2017 IEEE 23RD INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS), 2017, : 151 - 156
  • [7] Modeling Power Supply Noise Effects for System-Level Simulation of ΔΣ-ADCs
    Meier, Jonas
    Speicher, Fabian
    Beyerstedt, Christoph
    Saalfeld, Tobias
    Boronowsky, Gregor
    Wunderlich, Ralf
    Heinen, Stefan
    [J]. 2019 16TH INTERNATIONAL CONFERENCE ON SYNTHESIS, MODELING, ANALYSIS AND SIMULATION METHODS AND APPLICATIONS TO CIRCUIT DESIGN (SMACD 2019), 2019, : 265 - 268
  • [8] Power supply noise simulation considering dynamic effect of on-chip current
    Zhou, Yaping
    Dhong, Sang H.
    Nishino, Yoichi
    Harvey, Paul M.
    Mandrekar, Rohan
    Gervais, Gilles
    Criscolo, Nikki
    [J]. ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING, 2006, : 87 - +
  • [9] Coincidence damping and power supply circuits in integrated power modules
    Pereverzev, A.V.
    [J]. Elektrotekhnika, 1998, (07): : 53 - 56
  • [10] Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
    Ogasahara, Yasuhiro
    Hashimoto, Masanori
    Onoye, Takao
    [J]. 2008 ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2, 2008, : 7 - 8