Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA

被引：0

作者：

Amrbar, Mehran ^{[1
]}

Irom, Farokh ^{[1
]}

Guertin, Steven M. ^{[1
]}

Allen, Greg ^{[1
]}

机构：

[1] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA

来源：

2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2015年

关键词：

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

Heavy ion single-event effect (SEE) measurements on Xilinx Zynq-7000 are reported. Heavy ion susceptibility to Single-Event latchup (SEL), single event upsets (SEUs) of BRAM, configuration bits of FPGA and on chip memory (OCM) of the processor were investigated.

引用

页码：1 / 4

页数：4

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