Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA

被引：0
|
作者：
Amrbar, Mehran [1 ]
Irom, Farokh [1 ]
Guertin, Steven M. [1 ]
Allen, Greg [1 ]
机构：
[1] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA
来源：
2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2015年
关键词：
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
Heavy ion single-event effect (SEE) measurements on Xilinx Zynq-7000 are reported. Heavy ion susceptibility to Single-Event latchup (SEL), single event upsets (SEUs) of BRAM, configuration bits of FPGA and on chip memory (OCM) of the processor were investigated.
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页码：1 / 4
页数：4
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