共 8 条
- [1] Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA 2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2015, : 1 - 4
- [2] Heavy Ions Induced Single Event Upsets Testing of the 28 nm Xilinx Zynq-7000 All Programmable SoC 2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2015, : 29 - 34
- [3] On the Characterization of Embedded Memories of Zynq-7000 All Programmable SoC under Single Event Upsets Induced by Heavy Ions and Protons 2015 15TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS), 2015,
- [4] Heavy Ion and Proton Induced Single Event Effects on Xilinx Zynq UltraScale plus Field Programmable Gate Array (FPGA) 2018 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2018, : 311 - 315
- [5] Single Event Upset Characterization of the Zynq-7000 ARM® Cortex™-A9 Processor Unit Using Proton Irradiation 2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2015, : 76 - 78
- [6] HIGH-ENERGY ERDA WITH VERY HEAVY-IONS USING MASS AND ENERGY DISPERSIVE SPECTROMETRY NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 68 (1-4): : 235 - 240
- [7] Single-Event Characterization of Xilinx UltraScale plus ® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation 2018 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2018, : 189 - 193