InGaAs/GaAs vertical-cavity surface-emitting lasers with AlAs selective oxide layers

被引:0
|
作者
Hatori, N [1 ]
Mukaihara, T [1 ]
Ohnoki, N [1 ]
Mizutani, A [1 ]
Abe, M [1 ]
Matsutani, A [1 ]
Koyama, F [1 ]
Iga, K [1 ]
机构
[1] Tokyo Inst Technol, Precis & Intelligence Lab, Midori Ku, Yokohama, Kanagawa 226, Japan
关键词
optical interconnection; surface-emitting laser; AlAs oxide film (layer); dark recombination current;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A laser operating at low threshold current is indispensable for the construction of superparallel optical interconnections. Initially we examine the current threshold characteristics of surface emitting ZnGaAs/GaAs lasers, and demonstrate the possibility for working with a threshold current below 100 mu A. Next, vertical-cavity AlAs oxide layers are used, since they are helpful in achieving a low threshold surface-emitting laser, and the optimum conditions for forming the AlAs oxide layer are determined. New InGaAs/GaAs surface-emitting lasers with AlAs oxide layer are fabricated and a low threshold current operation of 70 mu A is achieved by current injection through micro-domains and reduction of the dark recombination current. Further low threshold current operation should be achievable by fine control and micronization of oxide layers. (C) 1998 Scripta Technica.
引用
收藏
页码:13 / 20
页数:8
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