A class-based clustering static compaction technique for combinational circuits

被引：0
|
作者：
El-Maleh, AH [1 ]
Osais, YE [1 ]
机构：
[1] King Fahd Univ Petr & Minerals, Dept Comp Engn, Dhahran 31261, Saudi Arabia
来源：
16TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS | 2004年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors.
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收藏
页码：522 / 525
页数：4
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