Measurement of Refractive Index Change in Nonlinear Crystals Using Wavefront Sensor

被引：0
|
作者：
Fuchimukai, Atsushi [1 ]
Sasaki, Yoichi [1 ]
Qu, Chen [1 ]
Tamaru, Yuki [1 ]
Miura, Taisuke [1 ]
Matsunaga, Takashi [1 ]
机构：
[1] Gigaphoton Inc, L400 Yokokurashinden, Oyama, Tochigi 3238558, Japan
来源：
2017 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR) | 2017年
关键词：
Wavelength conversion; deep ulitra violet; thermally induced effects; wavefront measurement;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We are developing the all-solid-state light source at 193-nm. In case of high average power wavelength conversion, thermally induced refractive index change induces phase mismatch in nonlinear crystal. We evaluated the refractive index change inside nonlinear crystals by using a large area wave front sensor with the spatial resolution of 44 microns.
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页数：2
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