Electrical properties and structural changes of thermally co-evaporated CuInSe films

被引:29
|
作者
Moharram, AH [1 ]
Hafiz, MM
Salem, A
机构
[1] Assiut Univ, Dept Phys, Assiut, Egypt
[2] UAE Univ, Dept Phys, Al Ain, U Arab Emirates
[3] El Azhar Univ, Dept Phys, Assiut, Egypt
关键词
thermal co-evaporation; CuInSe films; chalcopyrite structure;
D O I
10.1016/S0169-4332(00)00836-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Thermal co-evaporation technique (from two sources - Cu wire and In30Se70 ingots) was used to prepare CuInSe thin films. Controlling the evaporation rates from the sources was helpful to get films having different Cu/In content. The temperature dependence of the electrical conductivity was investigated in the temperature range 80K less than or equal to T less than or equal to 435 K. The density of localized states at the Fermi level and the activation energy for conduction are decreased on increasing the film (Cu/ In) content. The activation energy for conduction of the Cu20In20Se60 film decreases on increasing the annealing temperature. Tetragonal CuInSe2 and hexagonal Cu2Se crystalline phases resulting from heat treatment have been identified using X-ray diffractometry and transmission electron microscope. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:61 / 67
页数:7
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