Nano-deformation of crystalline domains during tensile stretching studied by atomic force microscopy

被引：0

作者：

McLean, RS ^{[1
]}

Sauer, BB ^{[1
]}

机构：

[1] Dupont Co, Cent Res & Dev, Expt Stn, Wilmington, DE 19880 USA

来源：

JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS | 1999年 / 37卷 / 08期

关键词：

atomic force microscopy; crystal; phase; morphology; deformation;

D O I：

10.1002/(SICI)1099-0488(19990415)37:8<859::AID-POLB11>3.0.CO;2-U

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

Atomic force microscopy (AFM) stretching experiments were performed on Pebax 3533 films. All the samples were macroscopically thick and required no staining or thin film sectioning. Nanometer-level resolution was applied to examine the small nonperiodic crystals. About 40 images were obtained to accurately account for the stress-strain behavior. Finally, the obtained images were analyzed.

引用

页码：859 / 866

页数：8

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