Nano-deformation of crystalline domains during tensile stretching studied by atomic force microscopy

被引：0
|
作者：
McLean, RS [1 ]
Sauer, BB [1 ]
机构：
[1] Dupont Co, Cent Res & Dev, Expt Stn, Wilmington, DE 19880 USA
来源：
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS | 1999年 / 37卷 / 08期
关键词：
atomic force microscopy; crystal; phase; morphology; deformation;
D O I：
10.1002/(SICI)1099-0488(19990415)37:8<859::AID-POLB11>3.0.CO;2-U
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
Atomic force microscopy (AFM) stretching experiments were performed on Pebax 3533 films. All the samples were macroscopically thick and required no staining or thin film sectioning. Nanometer-level resolution was applied to examine the small nonperiodic crystals. About 40 images were obtained to accurately account for the stress-strain behavior. Finally, the obtained images were analyzed.
引用
收藏
页码：859 / 866
页数：8
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